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[IEEE 2001 IEEE Nuclear Science Symposium Conference Record - San Diego, CA, USA (4-10 Nov. 2001)] 2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310) - PICTS analysis of extended defects in heavily irradiated silicon

✍ Scribed by Menichelli, D.; Bruzzi, M.; Borchi, E.; Zheng Li,

Book ID: 121323795
Publisher: IEEE
Year: 2002
Weight: 455 KB
Volume: 1
Category: Article
ISBN-13: 9780780373242
DOI: 10.1109/NSSMIC.2001.1008521

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