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[IEEE 2001 IEEE MTT-S International Microwave Symposium Digest - Phoenix, AZ, USA (20-25 May 2001)] 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) - Lifetime characterization of capacitive RF MEMS switches

✍ Scribed by Goldsmith, C.; Ehmke, J.; Malczewski, A.; Pillans, B.; Eshelman, S.; Yao, Z.; Brank, J.; Eberly, M.

Book ID: 118135412
Publisher: IEEE
Year: 2001
Weight: 453 KB
Volume: 1
Category: Article
ISBN-13: 9780780365384
DOI: 10.1109/mwsym.2001.966876

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