𝔖 Bobbio Scriptorium

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[IEEE 2001 IEEE International Frequency Control Symposium and PDA Exhibition - Seattle, WA, USA (6-8 June 2001)] Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218) - QCM and SAW transducers allow analyte detection from nanometer- to micrometer-dimensions using imprinting techniques

✍ Scribed by Dickert, F.L.; Greibl, W.; Haderspock, C.; Hayden, O.; Rohrer, A.; Scholl, G.; Wolff, U.

Book ID: 126604264
Publisher: IEEE
Year: 2001
Weight: 586 KB
Category: Article
ISBN-13: 9780780370289
DOI: 10.1109/FREQ.2001.956335

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