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[IEEE 2001 IEEE Industry Applications Society 36th Annual Meeting - IAS'01 - Chicago, IL, USA (30 Sept.-4 Oct. 2001)] Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248) - High current SiC JBS diode characterization for hard- and soft-switching applications

✍ Scribed by Lai, J.-S.; Huang, X.; Yu, H.; Hefner, A.R.; Berning, D.W.; Singh, R.

Book ID: 115472376
Publisher: IEEE
Year: 2001
Weight: 329 KB
Volume: 1
Category: Article
ISBN-13: 9780780371149
DOI: 10.1109/ias.2001.955449

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