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[IEEE 2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Kitchener, Ont., Canada (14-17 Oct. 2001)] 2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225) - Computed x-ray tomography for analyzing polymer insulators

✍ Scribed by Altafim, R.A.; Murakami, C.R.; Cruvinel, P.E.; Naime, J.M.; Chierice, G.O.; Mascarenhas, S.

Book ID: 126619464
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 386 KB
Category: Article
ISBN-13: 9780780370531
DOI: 10.1109/CEIDP.2001.963508

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