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[IEEE 2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Kitchener, Ont., Canada (14-17 Oct. 2001)] 2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225) - High voltage and current metrology at NIST. Precision measurements of the past, present, and the future

✍ Scribed by Fitzpatrick, G.J.; Simmon, E.D.

Book ID: 121812904
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 435 KB
Category: Article
ISBN-13: 9780780370531
DOI: 10.1109/CEIDP.2001.963538

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