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[IEEE 2001 1st IEEE Conference on Nanotechnology. IEEE-NANO 2001 - Maui, HI, USA (28-30 Oct. 2001)] Proceedings of the 2001 1st IEEE Conference on Nanotechnology. IEEE-NANO 2001 (Cat. No.01EX516) - Reliable prediction of deep sub-quarter micron CMOS technology performance

✍ Scribed by Palankovski, V.; Belova, N.; Grasser, T.; Puchner, H.; Aronowitz, S.; Selberherr, S.

Book ID: 111868118
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 464 KB
Volume: 0
Category: Article
ISBN-13: 9780780372153
DOI: 10.1109/nano.2001.966419

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