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[IEEE 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems - Cancun, Mexico (15-17 March 2000)] Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474) - Probe detectors for mapping manufacturing defects

✍ Scribed by Zanchi, A.; Zappa, F.; Ghioni, M.; Giudice, A.; Morrison, A.P.; Sinnis, V.S.

Book ID: 126742458
Publisher: IEEE
Year: 2000
Weight: 462 KB
Category: Article
ISBN-13: 9780780357662
DOI: 10.1109/ICCDCS.2000.869855

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