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[IEEE 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems - Cancun, Mexico (15-17 March 2000)] Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474) - Characterisation of radiation effects on MOSFET using genetic algorithms

✍ Scribed by Picos, R.; Roca, M.; Calvo, O.; Garcia-Moreno, E.

Book ID: 118199280
Publisher: IEEE
Year: 2000
Weight: 429 KB
Edition: 1st
Volume: 0
Category: Article
ISBN-13: 9780780357662
DOI: 10.1109/iccdcs.2000.869842

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