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[IEEE 2000 Power Electronics Specialist Conference - Galway, Ireland (18-23 June 2000)] 2000 IEEE 31st Annual Power Electronics Specialists Conference. Conference Proceedings (Cat. No.00CH37018) - Influence of gate internal impedance on losses in a power MOS transistor switching at a high frequency in the ZVS mode

✍ Scribed by Lefebvre, S.; Costa, F.; Miserey, F.

Book ID: 127022947
Publisher: IEEE
Year: 2000
Weight: 637 KB
Edition: 1
Volume: 3
Category: Article
ISBN-13: 9780780356924
DOI: 10.1109/pesc.2000.880545

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