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[IEEE 2000 International Symposium on Electromagnetic Compatibility (EMC 2000) - Washington, DC, USA (21-25 Aug. 2000)] IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016) - Rigorous modeling of the frequency dependence of ohmic losses in high-speed electrical interconnections

✍ Scribed by Coperich, K.M.; Cangellaris, A.C.; Ruehli, A.E.

Book ID: 127345842
Publisher: IEEE
Year: 2000
Weight: 582 KB
Volume: 1
Category: Article
ISBN-13: 9780780356771
DOI: 10.1109/isemc.2000.875582

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