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[IEEE 2000 International Symposium on Electromagnetic Compatibility (EMC 2000) - Washington, DC, USA (21-25 Aug. 2000)] IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016) - Experimental and numerical study of the radiation from microstrip bends

✍ Scribed by Wang, H.; Ji, Y.; Hubing, T.H.; Drewniak, J.L.; van Doren, T.P.; DuBroff, R.E.

Book ID: 120662010
Publisher: IEEE
Year: 2000
Weight: 269 KB
Volume: 2
Category: Article
ISBN-13: 9780780356771
DOI: 10.1109/ISEMC.2000.874713

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