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[IEEE 2000 International Semiconducting and Insulating Materials Conference. SIMC-XI - Canberra, ACT, Australia (3-7 July 2000)] 2000 International Semiconducting and Insulating Materials Conference. SIMC-XI (Cat. No.00CH37046) - Analysis of trap-related kink dynamics in GaAs MESFETs

✍ Scribed by Horio, K.; Wakabayashi, A.; Mitani, Y.

Book ID: 111657886
Publisher: IEEE
Year: 2000
Weight: 248 KB
Volume: 0
Category: Article
ISBN-13: 9780780358140
DOI: 10.1109/sim.2000.939256

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