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[IEEE 2000 IEEE/EIA International Frequency Control Symposium and Exhibition - Kansas City, MO, USA (7-9 June 2000)] Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) - Analysis of thickness modes of contoured, doubly-rotated quartz resonators

✍ Scribed by EerNisse, E.P.

Book ID: 126883604
Publisher: IEEE
Year: 2000
Weight: 483 KB
Edition: 2000
Category: Article
ISBN-13: 9780780358386
DOI: 10.1109/freq.2000.887377

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