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[IEEE 2000 IEEE/EIA International Frequency Control Symposium and Exhibition - Kansas City, MO, USA (7-9 June 2000)] Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) - Investigation of device low frequency noise in 28 GHz MMIC VCO

โœ Scribed by Kozhuharov, R.; Sakalas, P.; Zirath, H.


Book ID
121854366
Publisher
IEEE
Year
2000
Weight
299 KB
Edition
2000
Category
Article
ISBN-13
9780780358386

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