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[IEEE 2000 IEEE MTT-S International Microwave Symposium Digest - Boston, MA, USA (11-16 June 2000)] 2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017) - Analysis and experimental waveform study on inverse class class-F mode of microwave power FETs

✍ Scribed by Wei, C.J.; DiCarlo, P.; Tkachenko, Y.A.; McMorrow, R.; Bartle, D.

Book ID: 126980375
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 301 KB
Edition: 1st
Volume: 1
Category: Article
ISBN-13: 9780780356870
DOI: 10.1109/mwsym.2000.861106

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