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[IEEE 2000 IEEE MTT-S International Microwave Symposium Digest - Boston, MA, USA (11-16 June 2000)] 2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017) - Accurate determination of dielectric constant of substrate materials using modified Wolff model

✍ Scribed by Verma, Y.K.; Verma, A.K.

Book ID: 121294797
Publisher: IEEE
Year: 2000
Weight: 354 KB
Volume: 3
Category: Article
ISBN-13: 9780780356870
DOI: 10.1109/MWSYM.2000.862339

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