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[IEEE 2000 IEEE MTT-S International Microwave Symposium Digest - Boston, MA, USA (11-16 June 2000)] 2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017) - Rigorous RF and microwave oscillator phase noise calculation by envelope transient technique

✍ Scribed by Ngoya, E.; Rousset, J.; Argollo, D.

Book ID: 118256157
Publisher: IEEE
Year: 2000
Weight: 353 KB
Volume: 1
Category: Article
ISBN-13: 9780780356870
DOI: 10.1109/mwsym.2000.860892

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