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[IEEE 2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace - Anaheim, CA, USA (18-21 Sept. 2000)] 2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) - Designing a parallel, distributed test system

✍ Scribed by Starkloff, E.

Book ID: 126665073
Publisher: IEEE
Year: 2000
Weight: 350 KB
Category: Article
ISBN-13: 9780780358683
DOI: 10.1109/AUTEST.2000.885641

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