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[IEEE 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Victoria, BC, Canada (15-18 Oct. 2000)] 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.00CH37132) - A novel HV system for multi specimens aging tests under partial discharges and temperature

✍ Scribed by Candela, R.; Romano, P.; Schifani, R.

Book ID: 126752080
Publisher: IEEE
Year: 2000
Weight: 415 KB
Volume: 2
Category: Article
ISBN-13: 9780780364134
DOI: 10.1109/CEIDP.2000.884062

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