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[IEEE 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Victoria, BC, Canada (15-18 Oct. 2000)] 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.00CH37132) - Technique to examine the influence of voltage harmonics on leakage current based MOSA diagnostic indicator

✍ Scribed by Fernando, S.N.; Raghuveer, M.R.

Book ID: 120218376
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 260 KB
Volume: 2
Category: Article
ISBN-13: 9780780364134
DOI: 10.1109/CEIDP.2000.884030

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