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[IEEE 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Victoria, BC, Canada (15-18 Oct. 2000)] 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.00CH37132) - Study of creepage distance of the contaminated insulator in correlation with salt deposit density

✍ Scribed by Salam, M.A.; Ahmad, H.; Ahmad, A.S.; Fuad, S.A.; Paul, K.C.; Tamsir, T.; Buntat, Z.; Piah, M.A.M.

Book ID: 115489891
Publisher: IEEE
Year: 2000
Weight: 203 KB
Volume: 1
Category: Article
ISBN-13: 9780780364134
DOI: 10.1109/ceidp.2000.885265

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