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[IEEE 19th International Symposium on Discharge and Electrical Insulation in Vacuum - Xi'an, China (18-22 Sept. 2000)] Proceedings ISDEIV. 19th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.00CH37041) - On regime for increasing the breakdown strength of vacuum gap between the microchannel plate and screen of the image amplifier

✍ Scribed by Emelyanov, A.A.; Prokhodova, L.A.

Book ID: 126750551
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 237 KB
Volume: 2
Category: Article
ISBN-13: 9780780357914
DOI: 10.1109/DEIV.2000.879098

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