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[IEEE 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - Hyderabad, India (2006.01.3-2006.01.7)] 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - Phase change memory faults

✍ Scribed by Mohammad, M.G.; Terkawi, L.; Albasman, M.

Book ID: 115538106
Publisher: IEEE
Year: 2006
Weight: 252 KB
Volume: 0
Category: Article
ISBN-13: 9780769525020
DOI: 10.1109/vlsid.2006.134

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