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[IEEE 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference - Norfolk, VA, USA (12-16 July 1999)] 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) - Single event upset characteristics of some digital integrated frequency synthesizers

✍ Scribed by Dayaratna, L.; Seehra, S.S.; Bogorad, A.; Ramos, L.G.

Book ID: 121194529
Publisher: IEEE
Year: 1999
Weight: 308 KB
Edition: 1999
Category: Article
ISBN-13: 9780780356603
DOI: 10.1109/REDW.1999.816056

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