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[IEEE 1999 Design Automation Conference - New Orleans, LA, USA (21-25 June 1999)] Proceedings 1999 Design Automation Conference (Cat. No. 99CH36361) - On thermal effects in deep sub-micron VLSI interconnects

โœ Scribed by Banerjee, K.; Mehrotra, A.; Sangiovanni-Vincentelli, A.; Chenming Hu,


Book ID
120974927
Publisher
IEEE
Year
1999
Weight
829 KB
Edition
1999
Category
Article
ISBN-13
9781581130928

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