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[IEEE 1999 Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA (26-28 Sept. 1999)] Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.99CH37024) - Diffused resistor mismatch modeling and characterization

✍ Scribed by Drennan, P.G.

Book ID: 118241915
Publisher: IEEE
Year: 1999
Weight: 353 KB
Edition: 1999
Volume: 0
Category: Article
ISBN-13: 9780780357129
DOI: 10.1109/bipol.1999.803518

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