[IEEE 1998 URSI International Symposium on Signal, Systems, and Electronics. Conference Proceedings - Pisa, Italy (29 Sept.-2 Oct. 1998)] 1998 URSI International Symposium on Signals, Systems, and Electronics. Conference Proceedings (Cat. No.98EX167) - Computer-aided analysis of surface-state effects on gate-lag phenomena in GaAs MESFETs

✍ Scribed by Horio, K.; Yamada, T.

• Book ID: 111657866
• Publisher: IEEE
• Year: 1998
• Weight: 591 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780349001
• DOI: 10.1109/issse.1998.738111