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[IEEE 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206) - Seattle, WA, USA (25-28 May 1998)] 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206) - Electrical characterization of multilayered thin film integral passive devices

✍ Scribed by Morcan, G.; Lenihan, T.; Parkerson, J.P.; Schaper, L.; Ang, S.

Book ID: 126608796
Publisher: IEEE
Year: 1998
Weight: 760 KB
Category: Article
ISBN-13: 9780780345263
DOI: 10.1109/ECTC.1998.678700

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