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[IEEE 1998 IEEE International Workshop on IDDQ Testing - San Jose, CA, USA (November 12-13, 1998)] Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232) - Test input generation for supply current testing of bridging faults in bipolar combinational logic circuits

✍ Scribed by Kuchii, T.; Hashizume, M.; Tamesada, T.

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