𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Self-managed work teams at Harris Semiconductor, Mountaintop operations

✍ Scribed by Heffron, B.; Rerick, R.A.

Book ID: 126710810
Publisher: IEEE
Year: 1997
Weight: 624 KB
Category: Article
ISBN-13: 9780780340503
DOI: 10.1109/ASMC.1997.630736

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📜 SIMILAR VOLUMES

[IEEE 1997 IEEE/SEMI Advanced Semiconduc

[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Valuation of yield management investments

✍ Wang, E.; Holtan, M.; Akella, R.; Emami, I.; McIntyre, M.; Jensen, D.; Fletcher, 📂 Article 📅 1997 🏛 IEEE ⚖ 724 KB

[IEEE 1997 IEEE/SEMI Advanced Semiconduc

[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cycle time reduction for semiconductor wafer fabrication facilities

✍ Meyersdorf, D.; Yang, T. 📂 Article 📅 1997 🏛 IEEE ⚖ 558 KB

[IEEE 1997 IEEE/SEMI Advanced Semiconduc

[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Continuous flow manufacturing: the ultimate theory of constraints

✍ Ruelle, O. 📂 Article 📅 1997 🏛 IEEE ⚖ 537 KB

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[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - The influence of copper contamination on gate oxide integrity

✍ Vermeire, B.; Parks, H.G. 📂 Article 📅 1997 🏛 IEEE ⚖ 258 KB

[IEEE 1997 IEEE/SEMI Advanced Semiconduc

[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Copy EXACTLY! A paradigm shift in technology transfer method

✍ McDonald, C.J. 📂 Article 📅 1997 🏛 IEEE ⚖ 453 KB

[IEEE 1997 IEEE/SEMI Advanced Semiconduc

[IEEE 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Cambridge, MA, USA (10-12 Sept. 1997)] 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings - Advanced methods for analysis of wafer-to-wafer yield variation

✍ Pak, J.; Kittler, R.; Hopper, B.; Wen, P. 📂 Article 📅 1997 🏛 IEEE ⚖ 393 KB