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[IEEE 1997 IEEE Ultrasonics Symposium An International Symposium - Toronto, Ont., Canada (5-8 Oct. 1997)] 1997 IEEE Ultrasonics Symposium Proceedings. An International Symposium (Cat. No.97CH36118) - Influence of metallization on temperature stability of SAW devices

✍ Scribed by Henry, E.; Ballandras, S.; Bigler, E.; Marianneau, G.; Martin, G.; Camou, S.

Book ID: 111973516
Publisher: IEEE
Year: 1997
Weight: 336 KB
Volume: 1
Category: Article
ISBN-13: 9780780341531
DOI: 10.1109/ultsym.1997.663014

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