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[IEEE 1997 IEEE Autotestcon AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century - Anaheim, CA, USA (22-25 Sept. 1997)] 1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century - Integrated display for functional emulation during test

✍ Scribed by Bergfeld, D.B.

Book ID: 126706545
Publisher: IEEE
Year: 1997
Weight: 747 KB
Edition: 1997
Category: Article
ISBN-13: 9780780341623
DOI: 10.1109/AUTEST.1997.633688

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