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[IEEE 1997 IEEE Autotestcon AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century - Anaheim, CA, USA (22-25 Sept. 1997)] 1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century - Using simulation to improve fault coverage of analog and mixed-signal test program sets

✍ Scribed by Majernik, D.; Lynch, B.; Siegel, C.; Teegarden, D.; Eram, R.

Book ID: 126660599
Publisher: IEEE
Year: 1997
Weight: 37 KB
Edition: 1997
Category: Article
ISBN-13: 9780780341623
DOI: 10.1109/AUTEST.1997.633647

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