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[IEEE 1997 55th Annual Device Research Conference Digest - Fort Collins, CO, USA (23-25 June 1997)] 1997 55th Annual Device Research Conference Digest - A novel transient current technique to characterize process-induced thin oxide damage

✍ Scribed by Balasinski, A.; Singhal, P.M.; Morgan, L.; Hodges, N.; Spinner, C.

No coin nor oath required. For personal study only.

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