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[IEEE 1997 21st International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 Sept. 1997)] 1997 21st International Conference on Microelectronics. Proceedings - Reliability testing of power VDMOS transistors

โœ Scribed by Tosic, N.; Pesic, B.; Stojadinovic, N.

Book ID
121009321
Publisher
IEEE
Year
1997
Tongue
English
Weight
403 KB
Volume
2
Category
Article
ISBN-13
9780780336643

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โœฆ Synopsis

The International Conference on Microelectronics (MIEL) is one of the most outstanding European conferences, providing an international forum for the presentation and discussion of the recent development and future trends in the field of microelectronics.

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