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[IEEE 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference - Indian Wells, CA, USA (19 July 1996)] 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference - Dose rate and total dose noise performance of a commercial off the shelf dielectrically isolated JFET operational amplifier during irradiation

✍ Scribed by Hiemstra, D.M.

Book ID: 121284438
Publisher: IEEE
Year: 1996
Weight: 528 KB
Category: Article
ISBN-13: 9780780333987
DOI: 10.1109/REDW.1996.574181

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