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[IEEE 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA (29 Sept.-1 Oct. 1996)] Proceedings of the 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting - Lateral scaling of the self-aligned extrinsic base in SiGe HBTs

✍ Scribed by Jeng, S.J.; Greenberg, D.R.; Longstreet, M.; Nueckel, G.; Harame, D.L.; Jadus, D.

Book ID: 126638193
Publisher: IEEE
Year: 1996
Weight: 317 KB
Category: Article
ISBN-13: 9780780335165
DOI: 10.1109/BIPOL.1996.553888

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