𝔖 Bobbio Scriptorium

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[IEEE 1995 IEEE Ultrasonics Symposium. An International Symposium - Seattle, WA, USA (7-10 Nov. 1995)] 1995 IEEE Ultrasonics Symposium. Proceedings. An International Symposium - Rigorous analysis of finite SAW devices with arbitrary electrode geometries

✍ Scribed by Ventura, P.; Hode, J.M.; Lopes, B.

Book ID: 111657898
Publisher: IEEE
Year: 1995
Weight: 360 KB
Volume: 1
Category: Article
ISBN-13: 9780780329409
DOI: 10.1109/ultsym.1995.495578

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