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[IEEE 1995 IEEE MTT-S International Microwave Symposium - Orlando, FL, USA (16-20 May 1995)] Proceedings of 1995 IEEE MTT-S International Microwave Symposium - Simulation of temperature dependencies using a new and CAD suitable physical GaAs-MESFET model including the electron preheating effect

✍ Scribed by Nevermann, P.; Wolff, I.

No coin nor oath required. For personal study only.

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