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[IEEE 1995 IEEE Instrumentation and Measurement Technology Conference - IMTC '95 - Waltham, MA, USA (24-26 April 1995)] Proceedings of 1995 IEEE Instrumentation and Measurement Technology Conference - IMTC '95 - Simultaneous measurement of electrical and magnetic properties of a spherical sample

✍ Scribed by Yamazaki, S.; Negishi, T.; Nakane, H.; Tanaka, A.

Book ID: 121822797
Publisher: IEEE
Year: 1995
Weight: 377 KB
Category: Article
ISBN-13: 9780780326156
DOI: 10.1109/IMTC.1995.515380

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