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[IEEE 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Leicester, UK (10-13 July 1995)] Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Modelling of the influence of the layer pollution thickness in high voltage polluted insulators

✍ Scribed by do Prado, A.J.; Astorga, O.A.M.

Book ID: 121233562
Publisher: IEEE
Year: 1995
Weight: 204 KB
Category: Article
ISBN-13: 9780780320406
DOI: 10.1109/ICSD.1995.523038

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