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[IEEE 1994 VLSI Technology Symposium - Honolulu, HI, USA (7-9 June 1994)] Proceedings of 1994 VLSI Technology Symposium - Implications of fundamental threshold voltage variations for high-density SRAM and logic circuits

✍ Scribed by Burnett, D.; Erington, K.; Subramanian, C.; Baker, K.

No coin nor oath required. For personal study only.

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