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[IEEE 1994 IEEE International Conference on Industrial Technology - ICIT '94 - Guangzhou, China (5-9 Dec. 1994)] Proceedings of 1994 IEEE International Conference on Industrial Technology - ICIT '94 - An improved DMC algorithm used in measurement failure and it's application for paper machine control

โœ Scribed by Wu Fuming, ; Sun Demin, ; Zheng Jingbo,


Book ID
126703281
Publisher
IEEE
Year
1994
Weight
300 KB
Category
Article
ISBN-13
9780780319783

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