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[IEEE 1994 IEEE GaAs IC Symposium - Phildelphia, PA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE GaAs IC Symposium - Three-terminal breakdown effects in power MESFETs

โœ Scribed by Hanson, C.; Hua Fu, ; Golio, M.


Book ID
121872825
Publisher
IEEE
Year
1994
Weight
413 KB
Category
Article
ISBN-13
9780780319752

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