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[IEEE 1994 IEEE Applied Power Electronics Conference and Exposition - ASPEC'94 - Orlando, FL, USA (13-17 Feb. 1994)] Proceedings of 1994 IEEE Applied Power Electronics Conference and Exposition - ASPEC'94 - Characterization of an active clamp flyback topology for power factor correction applications

✍ Scribed by Watson, R.; Hua, G.C.; Lee, F.C.

Book ID: 117993041
Publisher: IEEE
Year: 1994
Weight: 529 KB
Volume: 0
Category: Article
ISBN-13: 9780780314566
DOI: 10.1109/apec.1994.316369

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