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[IEEE 1994 37th Midwest Symposium on Circuits and Systems - Lafayette, LA, USA (3-5 Aug. 1994)] Proceedings of 1994 37th Midwest Symposium on Circuits and Systems - Measurement-based modeling of microwave transistor package and test-fixture for device S-parameter deembedding

✍ Scribed by Calandra, E.F.

Book ID: 121355717
Publisher: IEEE
Year: 1994
Weight: 426 KB
Volume: 2
Category: Article
ISBN-13: 9780780324282
DOI: 10.1109/MWSCAS.1994.519030

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