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[IEEE 1993 International Symposium on VLSI Technology, Systems, and Applications Technical Papers - Taipei, Taiwan (12-14 May 1993)] 1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers - Sub-100 nm CMOS/SIMOX delay modeling by time-dependent gate capacitance model

✍ Scribed by Lee, M.; Asada, K.

Book ID: 126762792
Publisher: IEEE
Year: 1993
Weight: 369 KB
Category: Article
ISBN-13: 9780780309784
DOI: 10.1109/VTSA.1993.263597

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