[IEEE 1993 IEEE Radiation Effects Data Workshop - Snowbird, UT, USA (21 July 1993)] 1993 IEEE Radiation Effects Data Workshop - Design And Testing Of SEU/ SEL Immune Memory And Logic Circuits In A Commercial Cmos Process

✍ Scribed by Wiseman, D.; Canaris, J.; Whitaker, S.; Venbrux, J.; Cameron, K.; Arave, K.; Arave, L.; Liu, M.N.; Liu, K.

• Book ID: 118056142
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 333 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780319066
• DOI: 10.1109/redw.1993.700568