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[IEEE 1993 IEEE MTT-S International Microwave Symposium Digest - Atlanta, GA, USA (14-18 June 1993)] 1993 IEEE MTT-S International Microwave Symposium Digest - A new probe for W-band on-wafer measurements

✍ Scribed by Liu, S.M.J.; Boll, G.G.

Book ID: 121874426
Publisher: IEEE
Year: 1993
Weight: 325 KB
Category: Article
ISBN-13: 9780780312098
DOI: 10.1109/MWSYM.1993.277123

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